| Description |
1 online resource |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; v. 214 |
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Advances in imaging and electron physics ; v. 214.
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| Bibliography |
Includes bibliographical references and index. |
| Contents |
Front Cover -- Computer Techniques for Image Processing in Electron Microscopy -- Copyright -- Contents -- Contributor -- Foreword -- Editorial Preface -- Preface -- 1 Image formation theory -- 1.1 Electron optics -- 1.2 Beam-specimen interaction -- 1.3 Linear imaging -- 1.4 Nonlinear imaging -- 1.5 Image analysis and object reconstruction -- 1.6 Resolution, contrast, noise, and radiation damage -- 2 The discrete Fourier transform -- 2.1 De nition and fundamental properties -- 2.2 Approximation of integral transforms -- 2.3 Multidimensional forms -- 3 Analytic images -- 3.1 Complex zeros |
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3.2 Zero ipping -- 3.3 Periodic images -- 3.4 Two-dimensional forms -- 3.5 The one-sided diffraction plane constraint -- 3.6 Logarithmic Hilbert transforms -- 3.7 The realizability of the one-sided constraint -- 3.8 Logarithmic Hilbert transforms in dark- eld conditions -- 4 The image and diffraction plane problem: uniqueness -- 4.1 Statement of the problem -- 4.2 Data constraints and trivial uniqueness failures -- 4.3 An important failure of uniqueness -- 4.4 The continuous aperiodic problem -- 4.5 The periodic and discrete problems -- 4.6 Summary |
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5 The image and diffraction plane problem: numerical methods -- 5.1 Direct methods -- 5.2 Steepest descent methods -- 5.3 The iterative transform method -- 5.A -- 5.A.1 Derivatives of functions of complex variables -- 5.A.2 Sum square residue gradient calculation -- 5.A.3 The image and diffraction plane algorithm -- 6 The image and diffraction plane problem: computational trials -- 6.1 Real problems and mathematical models -- 6.2 The steepest descent method -- 6.3 The iterative Fourier transform method -- 6.4 The matrix inversion method -- 7 Alternative data for the phase determination |
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7.1 Defocus pairs -- 7.2 Bright- eld/dark- eld diffraction pattern sets -- 7.3 Further possible data -- 7.4 An assessment of phase determination -- 8 The hardware of digital image handling -- 8.1 Optical or digital manipulation? -- 8.2 Digitization and regeneration -- 8.3 Processors, representation, and storage -- 9 Basic software for digital image handling -- 9.1 A processing system -- 9.2 Input, output, and data selection -- 9.3 Transformation -- 9.4 Correlation and lateral alignment -- 9.5 Alignment in orientation and magni cation -- 9.6 Averaging repeated structures |
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9.7 Object reconstruction -- 10 Improc -- 10.1 The objectives and environment -- 10.2 The implementation technique -- 10.3 The language structure -- 10.4 Specimen programs -- 10.5 The Improc macro de nitions -- 10.6 Recent extensions -- A10 -- A10.1 Speci cation of Improc statements -- A10.2 The Improc macro de nitions -- A10.3 Fortran generated from Improc programs (Section 10.4) -- From Table 10.4.1 -- From Table 10.4.2 -- From Table 10.4.3 -- From Table 10.4.4 -- References -- Index -- Back Cover |
| Subject |
Image processing -- Digital techniques.
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Electron microscopy -- Technique.
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Traitement d'images -- Techniques numériques.
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Microscopie électronique -- Technique.
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digital imaging.
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Electron microscopy -- Technique
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Image processing -- Digital techniques
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| Added Author |
Htch, Martin.
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Hawkes, P. W.
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| Other Form: |
Print version: Computer techniques for image processing in electron microscopy. [Place of publication not identified] : Academic Press, 2020 0128209992 9780128209998 (OCoLC)1127930783 |
| ISBN |
9780128210000 (electronic bk.) |
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0128210001 (electronic bk.) |
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9780128209998 |
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0128209992 |
| Standard No. |
AU@ 000067252995 |
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UKMGB 019801767 |
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