| Description |
1 online resource |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Woodhead publishing series in electronic and optical materials ; 88 |
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Woodhead Publishing series in electronic and optical materials ; 88.
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| Note |
Online resource; title from PDF title page (EBSCO, viewed March 31, 2016). |
| Bibliography |
Includes bibliographical references and index. |
| Summary |
Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures. Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries. Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress. |
| Contents |
Front Cover; Materials Characterization Using Nondestructive Evaluation (NDE) Methods#; Related titles; Materials Characterization Using Nondestructive Evaluation (NDE) Methods; Copyright; Contents; List of contributors; Woodhead Publishing Series in Electronic and Optical Materials; 1 -- Atomic force microscopy (AFM) for materials characterization; 1.1 Introduction; 1.2 Comparison of AFM with other microscopy techniques; 1.3 Principles of AFM technique; 1.4 Construction and basic components of AFM; 1.5 Working modes of AFM; 1.5.1 Contact mode; 1.5.2 Noncontact mode; 1.5.3 Tapping mode |
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1.6 Application of AFM for material characterization1.6.1 Surface properties measurement; 1.6.2 AFM measurements for hardness and modulus measurements; 1.6.3 AFM measurements for damage characterizations; 1.6.4 AFM measurements for characterizations of surface treatment effects; 1.7 Conclusions; Acknowledgments; References; 2 -- Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization; 2.1 Introduction; 2.2 Why electron microscopy?; 2.2.1 Key advantages of imaging with electrons; 2.2.2 Key disadvantages of imaging with electrons |
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2.3 Types of microscopes2.4 Interaction of electrons with materials; 2.4.1 Elastic versus inelastic electron scattering; 2.4.2 Signals from the specimen; 2.5 What material features can we analyze using electron microscopy?; 2.5.1 Practical electron microscopy; 2.6 Scanning electron microscopy; 2.6.1 Key features of the SEM microscope; 2.6.2 Specimen preparation; 2.6.3 SEM detectors; 2.7 Key microstructural features analyzed by SEM; 2.7.1 Specimen shape; 2.7.2 Specimen composition; 2.7.3 Surface crystallography; 2.8 Transmission electron microscopy; 2.8.1 Key features of the TEM microscope |
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2.8.2 TEM specimen preparation2.9 TEM imaging modes; 2.10 TEM spectroscopy; 2.10.1 X-ray analysis in TEM (EDX); 2.10.2 Electron energy loss spectrometry; 2.11 Key applications of TEM; 2.12 Is electron microscopy a nondestructive technique?; 2.12.1 Specimen preparation; 2.12.2 Specimen changes during imaging; 2.12.3 Strategies for minimizing specimen damage; 2.13 Outlook for SEM and TEM; References; 3 -- X-ray microtomography for materials characterization; 3.1 Introduction; 3.2 Imaging physics; 3.2.1 X-ray microfocus tubes; 3.2.2 Interaction of hard X-rays with materials |
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3.2.2.1 X-ray attenuationPhoton absorption; Compton scattering; 3.2.2.2 Phase contrast imaging; 3.2.3 X-ray detectors and imaging devices: principles, features, and common systems; 3.3 Principles of microcomputed tomography; 3.4 Geometrical considerations and data acquisition; 3.5 System design (CT methods); 3.6 Image reconstruction; 3.7 Image quality; 3.8 Radiation exposure; 3.9 Examples of important and/or frequent applications for materials characterization; 3.10 Conclusions and future trends; 3.11 Further literature; References |
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4 -- X-ray diffraction (XRD) techniques for materials characterization |
| Subject |
Materials -- Analysis.
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Matériaux -- Analyse.
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TECHNOLOGY & ENGINEERING -- Metallurgy.
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Materials -- Analysis
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| Added Author |
Hübschen, Gerhard, editor.
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Altpeter, Iris, editor.
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Tschuncky, Ralf, editor.
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Herrmann, Hans-Georg, editor.
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| Other Form: |
Print version: Huebschen, Gerhard. Materials Characterization Using Nondestructive Evaluation (NDE) Methods. : Elsevier Science, ©2016 9780081000403 |
| ISBN |
9780081000571 (electronic bk.) |
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008100057X (electronic bk.) |
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9780081000403 |
| Standard No. |
AU@ 000061156051 |
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CHBIS 010796233 |
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CHVBK 403940141 |
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DEBSZ 482469951 |
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GBVCP 879396229 |
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