| Description |
1 online resource (xv, 318 pages) : illustrations. |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; v. 108 |
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Advances in imaging and electron physics.
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| Bibliography |
Includes bibliographical references and index. |
| Note |
Print version record. |
| Summary |
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Contents |
Front Cover; Modern Map Methods in Particle Beam Physics; Copyright Page; Contents; Chapter 1. Dynamics of Particles and Fields; 1.1 Beams and Beam Physics; 1.2 Differential Equations, Determinism, and Maps; 1.3 Lagrangian Systems; 1.4 Hamiltonian Systems; 1.5 Fields and Potentials; Chapter 2. Differential Algebraic Techniques; 2.1 Function Spaces and Their Algebras; 2.2 Taylor Differential Algebras; 2.3 Advanced Methods; Chapter 3. Fields; 3.1 Analytic Field Representation; 3.2 Practical Utilization of Field Information; Chapter 4. Maps: Properties; 4.1 Manipulations; 4.2 Symmetries |
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4.3 RepresentationsChapter 5. Maps: Calculation; 5.1 The Particle Optical Equations of Motion; 5.2 Equations of Motion for Spin; 5.3 Maps Determined by Algebraic Relations; Chapter 6. Imaging Systems; 6.1 Introduction; 6.2 Aberrations and their Correction; 6.3 Reconstructive Correction of Aberrations; 6.4 Aberration Correction via Repetitive Symmetry; Chapter 7. Repetitive Systems; 7.1 Linear Theory; 7.2 Parameter-Dependent Linear Theory; 7.3 Normal Forms; 7.4 Symplectic Tracking; References; Index |
| Language |
English. |
| Subject |
Electrons.
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Particle beams.
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Electrons |
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Électrons.
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Faisceaux de particules.
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Electrons
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Particle beams
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| Added Author |
Berz, M.
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| Added Title |
Imaging and electron physics |
| Other Form: |
0-12-014750-5 |
| ISBN |
0120147505 (electronic bk.) |
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9780120147502 (electronic bk.) |
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9786611719036 |
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6611719032 |
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0080577741 |
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9780080577746 |
| Standard No. |
CHBIS 010355150 |
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CHVBK 329743031 |
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DEBSZ 405329571 |
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DEBSZ 482460350 |
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AU@ 000066217740 |
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