| Description |
1 online resource (174 pages) |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Durability, robustness and reliability of photonic devices set |
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Durability, robustness and reliability of photonic devices set.
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| Note |
Online resource; title from PDF title page (EBSCO, viewed March 21, 2017). |
| Bibliography |
Includes bibliographical references and index. |
| Contents |
Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures. |
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3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover. |
| Subject |
Light emitting diodes.
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Diodes électroluminescentes.
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TECHNOLOGY & ENGINEERING -- Mechanical.
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Light emitting diodes
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| Added Author |
Béchou, Laurent, author.
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| Other Form: |
Print version: Deshayes, Yannick. Reliability, robustness and failure mechanisms of led devices : methodology and evaluation. London, England ; Oxford, England : ISTE Press ; Elsevier, ©2016 viii, 160 pages 9781785481529 |
| ISBN |
9780081010884 (electronic bk.) |
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0081010885 (electronic bk.) |
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9781785481529 |
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1785481525 |
| Standard No. |
AU@ 000059643999 |
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AU@ 000066135549 |
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CHNEW 001013896 |
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DEBSZ 482474777 |
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GBVCP 879417765 |
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