Kids Library Home

Welcome to the Kids' Library!

Search for books, movies, music, magazines, and more.

     
Available items only
E-Book/E-Doc

Title Defects in Advanced Electronic Materials and Novel Low Dimensional Structures / edited by Jan Stehr, Irina Buyanova, Weimin Chen.

Publication Info. Duxford, United Kingdom : Woodhead Publishing, an imprint of Elsevier, [2018]
©2018

Copies

Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Description 1 online resource
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series Woodhead Publishing series in electronic and optical materials
Note Online resource; title from PDF title page (EBSCO, viewed June 21, 2018).
Bibliography Includes bibliographical references and index.
Summary "Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap. Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"-- Provided by publisher
Subject Smart materials -- Defects.
Nanostructured materials -- Defects.
Matériaux intelligents -- Défauts.
Nanomatériaux -- Défauts.
TECHNOLOGY & ENGINEERING -- Engineering (General)
TECHNOLOGY & ENGINEERING -- Reference.
Added Author Chen, Weimin, editor.
Stehr, Jan, editor.
Buyanova, Irina, editor.
Other Form: Print version: 0081020538 9780081020531 (OCoLC)1011515167
ISBN 9780081020548 (electronic bk.)
0081020546 (electronic bk.)
9780081020531
0081020538
Standard No. AU@ 000063596658
UKMGB 018870076

 
    
Available items only