Kids Library Home

Welcome to the Kids' Library!

Search for books, movies, music, magazines, and more.

     
Available items only
E-Book/E-Doc
Author Cho, Yasuo.

Title Scanning nonlinear dielectric microscopy : investigation of ferroelectric, dielectric, and semiconductor materials and devices / Yasuo Cho.

Imprint Duxford : Woodhead Publishing, 2020.

Copies

Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Description 1 online resource
text txt rdacontent
still image sti rdacontent
computer c rdamedia
online resource cr rdacarrier
Series Woodhead Publishing Series in Electronic and Optical Materials
Woodhead Publishing series in electronic and optical materials.
Note Includes index.
Contents Front Cover -- Scanning Nonlinear Dielectric Microscopy -- Copyright Page -- Contents -- Preface -- 1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric materials -- 1.1 Basic theory -- 1.1.1 Macroscopic phenomenological definition of linear and nonlinear dielectric constants -- 1.1.2 Capacitance variation with alternating electric field -- 1.2 System setup of scanning nonlinear dielectric microscopy -- 1.3 Theory for nonlinear dielectric imaging -- 1.3.1 General theorem for capacitance variation under applied electric field
1.3.2 Theoretical calculation for scanning nonlinear dielectric microscopy image -- 1.4 Higher-order scanning nonlinear dielectric microscopy -- 1.4.1 Theory -- 1.4.2 Theoretical one-dimensional image and depth sensitivity of higher-order scanning nonlinear dielectric microscopy -- References -- 2 Ferroelectric polarization measurement -- 2.1 Analysis of distributions of ferroelectric domains on a microscopic scale using scanning nonlinear dielectric microscopy -- 2.2 Higher-order nonlinear dielectric analyses -- References -- 3 Three-dimensional polarization measurement
3.1 Basics of three-dimensional polarization distribution assessment -- 3.2 Principles of three-dimensional polarization assessment using scanning nonlinear dielectric microscopy -- 3.3 Lateral assessment by Kelvin force microscopy with electric field correction -- 3.4 Lateral nanoscale assessment with electric field correction -- References -- 4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy -- 4.1 Ferroelectric probe memory based on scanning nonlinear dielectric microscopy with a linear scanning stage
4.1.1 Scanning nonlinear dielectric microscopy with a linear scanning stage for ultrahigh-density ferroelectric data storage -- 4.1.2 Analysis of nanodomain dots in congruent single-crystal LiTaO3 -- 4.1.3 Manipulating nanodomains using scanning nonlinear dielectric microscopy with a linear scanning stage -- 4.2 Hard-disk-drive-type scanning nonlinear dielectric microscopy ferroelectric probe memory -- 4.2.1 Background on development of ultrahigh-density hard-disk-drive-type scanning nonlinear dielectric microscopy ferroele ...
4.2.2 An scanning nonlinear dielectric microscopy ferroelectric data storage system having an hard disk drive format -- 4.2.3 Ferroelectric recording media for scanning nonlinear dielectric microscopy probe memory having an hard disk drive format -- 4.2.4 Rapid R/W characteristics of an scanning nonlinear dielectric microscopy data storage system -- 4.2.5 An hard disk drive scanning nonlinear dielectric microscopy data storage unit for high-density ferroelectric recording
Subject Materials -- Analysis.
Microscopy.
Microscopy
Matériaux -- Analyse.
Microscopie.
microscopy.
Materials -- Analysis
Microscopy
Other Form: Print version: 0128172460 9780128172469 (OCoLC)1127934545
ISBN 9780081028032 (electronic bk.)
0081028032 (electronic bk.)
9780128172469
0128172460
Standard No. AU@ 000067312805
UKMGB 019806793

 
    
Available items only