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Title Neutron and X-Ray microscopy Part 2 / edited by Ted Cremer.

Imprint Amsterdam : Academic, 2012.

Copies

Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Description 1 online resource (360 pages).
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series Advances in imaging and electron physics ; v. 173
Summary This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field.
Note Print version record.
Subject Optoelectronic devices.
Optical data processing.
Dispositifs optoélectroniques.
Traitement optique de l'information.
Optical data processing
Optoelectronic devices
Added Author Cremer, Ted.
Other Form: Print version: 9781282234055
ISBN 9780123969699 (electronic bk.)
0123969697 (electronic bk.)
0123969697
9781282234055
1282234056
Standard No. CHBIS 010355214
CHVBK 329755595
DEBSZ 405345844
GBVCP 825908329
AU@ 000066218926

 
    
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