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ElectronicResource GovDoc

Author

Danyluk, Steven S.

Title Full field birefringence measurement of grown-in stresses in thin silicon sheet [electronic resource] : final technical report 2 January 2002 - 15 January 2008 / S. Danyluk, S. Ostapenko.

Imprint

Golden, Colo. : National Renewable Energy Laboratory, [2008]

Connect to
Connect to https://permanent.fdlp.gov/LPS110434/LPS110434/www.nrel.gov/docs/fy09osti/44237.pdf

Copies

Location	Call No.	OPAC Message	Status
Axe Federal Documents Online	E 9.18:NREL/SR-520-44237	---	Available

Description	23 p. : digital, PDF file
Series	Subcontract report ; NREL/SR-520-44237
	NREL/SR ; 520-44237.
System Details	Mode of access: Internet from the NREL web site. Address as of 3/19/09: http://www.nrel.gov/docs/fy09osti/44237.pdf; current access available via PURL.
Note	Title from title screen (viewed on Mar. 19, 2009).
	"November 2008."
Subject	Photovoltaic cells -- Research.
	Solar cells -- Design and construction.
Added Author	Ostapenko, S.
	National Renewable Energy Laboratory (U.S.)
Other Form:	Danyluk, Steven S. Full field birefringence measurement of grown-in stresses in thin silicon sheet 23 p. (OCoLC)272405646
Gpo Item No.	0430-P-05 (online)
Sudoc No.	E 9.18:NREL/SR-520-44237