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Title
Oxide reliability [electronic resource] : a summary of silicon oxide wearout, breakdown, and reliability / editor, D.J. Dumin.
Imprint
[River Edge, NJ] : World Scientific, c2002.
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Available to Pittsburg State University patrons only.
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Call No.
OPAC Message
Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
ix, 270 p. : ill.
Series
Selected topics in electronics and systems ; v. 23
Selected topics in electronics and systems ; v. 23.
Bibliography
Includes bibliographical references.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject
Metal oxide semiconductors -- Reliability.
Silicon oxide -- Deterioration.
Genre/Form
Electronic books.
Added Author
Dumin, D. J.
ProQuest (Firm)
ISBN
9810248423
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