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Print Material
Author Egerton, R. F.

Title Physical principles of electron microscopy : an introduction to TEM, SEM, and AEM / Ray F. Egerton.

Imprint New York : Springer Science+Business Media, c2005.


Location Call No. OPAC Message Status
 Axe 2nd Floor Stacks  502.825 Eg28p 2005    ---  Available
Description xii, 202 p. : ill. ; 25 cm.
Bibliography Includes bibliographical references (p. [195]-196) and index.
Subject Electron microscopy.
ISBN 0387258000 (hd. bd.)
9780387258003 (hd. bd.)
Standard No. 9780387258003
OHX har055016589
NLC 20060035382
NLGGC 283593792
YDXCP 2232330

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