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Authors (1-6 of 6)
Hacke Peter
1
ElectronicResource GovDoc
 

Influence of impurities in module packaging on potential-induced degradation



Golden, Colo. : National Renewable Energy Laboratory, [2012] 2012

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 Axe Federal Documents Online  E 9.16:NREL/TP-5200-56301    ---  Available
2
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Requirements for a standard test to rate the durability of PV modules at system voltage



Golden, Colo. : National Renewable Energy Laboratory, [2011] 2011

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 Axe Federal Documents Online  E 9.22:NREL/PR-5200-51099    ---  Available
3
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Research opportunities in reliability of photovoltaic modules


Hacke, Peter.
[Golden, Colo.] : National Renewable Energy Laboratory, [2010] 2010

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 Axe Federal Documents Online  E 9.22:NREL/PR-520-49001    ---  Available
4
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System voltage potential-induced degradation mechanisms in PV modules and methods for test preprint



[Golden, CO] : National Renewable Energy Laboratory, [2011] 2011

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 Axe Federal Documents Online  E 9.17:NREL/CP-5200-50716    ---  Available
5
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Test-to-failure of crystalline silicon modules preprint


Hacke, Peter.
Golden, CO : National Renewable Energy Laboratory, [2010] 2010

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 Axe Federal Documents Online  E 9.17:NREL/CP-5200-47755    ---  Available
6
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The value proposition for high lifetime (p-type) and thin silicon materials in solar PV applications


Goodrich, Alan.
[Golden, CO] : National Renewable Energy Laboratory, [2012] 2012

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 Axe Federal Documents Online  E 9.17:NREL/CP-6 A 20-55477    ---  Available
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