Front Cover; Advances in Imaging and Electron Physics; Copyright; Contents; Contributors; Della Grayson: a Tribute; Preface; Future Contributions; Chapter One: Direct Digital Electron Detectors; 1. Introduction; 2. Detector Characterization; 2.1. The MTF; 2.2. The Noise Power Spectrum; 2.3. The DQE; 2.4. Radiation Hardness; 3. Detector Types; 3.1. Detection Modes; 3.1.1. Integrating Detection; 3.1.2. Counting Detection; 3.2. Sensor Structures; 3.2.1. Hybrid Sensors; 3.2.2. Monolithic Active Pixel Sensors; 3.3. Comparisons of Direct Detectors; 4. Future Advances; References.
Chapter Two: Transmission Electron Microscopy: Emerging Investigations for Cultural Heritage Materials1. Introduction; 1.1. Cultural Heritage Materials and Materials Science; 1.2. Transmission Electron Microscopy; 2. Sampling and Sample Preparation; 3. Standard TEM; 4. Advanced Techniques and Further Developments; 5. Conclusion; References; Chapter Three: Quest for Ultimate Resolution Using Coherent Electron Waves: An Aberration-Corrected High-Voltage Electron ... ; 1. Introduction; 2. Resolution of TEM; 3. Early Efforts in Electron Microscopy; 4. Birth of Coherent Electron Waves.
5. Development of the High-Voltage Electron Microscope6. The Era of the Aberration-Corrected Electron Microscope; 6.1. Software-Type Aberration Correction; 6.2. Hardware-Type Aberration Corrector; 6.3. Evolution of Hardware-Type Aberration Corrector; 7. Aberration-Corrected High-Voltage TEM; 8. Conclusion and Outlook; Acknowledgments; References; Index; Contents of Volumes 151-197; Back Cover.
