Description |
1 online resource (6 p.) : ill. |
Series |
NREL/CP ; 5200-50685 |
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Conference paper (National Renewable Energy Laboratory (U.S.)) ; 5200-50685.
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Note |
Title from title screen (viewed August 29, 2011). |
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"July 2011." |
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"Conference paper." |
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"Presented at the 37th IEEE Photovoltaic Specialists Conference (PVSC 37), Seattle, Washington, June 19-24, 2011." |
Summary |
A finite element model has been created to quantify the thermal fatigue damage of the CPV die attach. Simulations are used to compare to results of empirical thermal fatigue equations originally developed for accelerated chamber cycling. While the empirical equations show promise when extrapolated to the lower temperature cycles characteristic of weather-induced temperature changes in the CPV die attach, it is demonstrated that their damage does not accumulate linearly: the damage a particular cycle contributes depends on the preceding cycles. Simulations of modeled CPV cell temperature histories provided for direct comparison of the FEM and empirical methods, and for calculation of equivalent times provided by standard accelerated test sequences. |
Bibliography |
Includes bibliographical references (p. 6). |
Note |
"Contract no. DE-AC36-08GO28308." |
Subject |
Solar concentrators -- Research.
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Materials -- Fatigue -- Mathematical models.
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Photovoltaic cells.
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Added Author |
Silverman, Timothy J.
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Kurtz, S. R.
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National Renewable Energy Laboratory (U.S.)
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IEEE Photovoltaic Specialists Conference (37th : 2008 : Seattle, Wash.)
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Added Title |
Modeling thermal fatigue in concentrating photovoltaic cell assemblies |
Gpo Item No. |
0430-OP-04 (online) |
Sudoc No. |
E 9.17:NREL/CP-5200-50685 |
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