| Description |
1 online resource (xxiii, 451 pages) : illustrations |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; 116 |
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Advances in imaging and electron physics ; 116.
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| Bibliography |
Includes bibliographical references and index. |
| Summary |
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Note |
Print version record. |
| Contents |
Front Cover; Advances in Imaging and Electron Physics: Numerical Field Calculation for Charged Particle Optics; Copyright Page; Contents; Preface; Future Contributions; Acknowledgments; Introduction; Chapter I. Basic Field Equations; 1.1 Maxwell's Equations; 1.2 Electromagnetic Potentials; 1.3 Variational Principles; 1.4 Wave Equations and Hertz Vectors; 1.5 Boundary Conditions; 1.6 Integral Equations for Electrostatic Fields; 1.7 Integral Equations for Magnetic Fields; 1.8 Integral Equations for Wave Fields; References; Chapter II. Reducible Systems; 2.1 Azimuthal Fourier-Series Expansions |
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2.2 Rotationally Symmetric Boundaries2.3 Magnetic Round Lenses; 2.4 Series Expansions; 2.5 Planar Fields; References; Chapter III. Basic Mathematical Tools; 3.1 Orthogonal Coordinate Systems; 3.2 Interpolation and Numerical Differentiation; 3.3 Modified Interpolation Kernels; 3.4 Mathematical Representation of Curves; 3.5 Mathematical Representation of Surfaces; 3.6 Numerical Integration; References; Chapter IV. The Finite-Difference Method (FDM); 4.1 Two-Dimensional Meshes; 4.2 Five-Point Configurations; 4.3 Nine-Point Configurations; 4.4 The Cylindrical Poisson Equation |
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4.5 Irregular Configurations4.6 Subdivision of Meshes; 4.7 Concluding Remarks; References; Chapter V. The Finite-Element Method (FEM); 5.1 Generation of Meshes; 5.2 Discretization of the Variational Principle; 5.3 Analysis in Triangular Elements; 5.4 The Finite-Element Method in First Order; 5.5 Field Interpolation; 5.6 Solutions of Large Systems of Equations; References; Chapter VI. The Boundary Element Method; 6.1 Discretization of Integral Equations; 6.2 Axially Symmetric Integral Equations; 6.3 Numerical Solution of Integral Equations |
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6.4 Special Techniques for Asymmetric Integral Equations6.5 The Calculation of External Fields; 6.6 Other Applications of Integral Equations; References; Chapter VII. Hybrid Methods; 7.1 Combination of the FEM with the BEM; 7.2 Combination of the FDM with the BEM; 7.3 The Charge Simulation Method (CSM); 7.4 The Current Simulation Model; 7.5 The General Alternation Method; 7.6 Fast Field Calculation; 7.7 Calculation of Equipotentials; References; Appendix; Index |
| Language |
English. |
| Subject |
Electrons.
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Image processing.
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Electronics.
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Électrons.
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Traitement d'images.
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Électronique.
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image processing.
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electronic engineering.
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SCIENCE -- Physics -- Nuclear.
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SCIENCE -- Physics -- Atomic & Molecular.
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Electronics
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Electrons
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Image processing
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| Other Form: |
Print version: Kasper, E. (Erwin), 1933- Numerical field calculation for charged particle optics. San Diego [Calif.] : Academic Press, ©2001 0120147580 9780120147588 (OCoLC)48742023 |
| ISBN |
9780080526218 (electronic bk.) |
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0080526217 (electronic bk.) |
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0120147580 (electronic bk.) |
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9780120147588 (electronic bk.) |
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1281054054 |
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9781281054050 |
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9786611054052 |
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6611054057 |
| Standard No. |
CHBIS 010355158 |
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DEBSZ 405317158 |
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UKMGB 017548697 |
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