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Author Ohring, Milton, 1936- author.

Title Reliability and failure of electronic materials and devices / Milton Ohring (Department of Materials Science and Engineering, Stevens Institute of Technology, Hoboken, New Jersey), Lucian Kasprzak (IBM Retired, Bear, Delaware).

Publication Info. London, UK : Academic Press is an imprint of Elsevier, [2015]
2015

Copies

Location Call No. OPAC Message Status
 Axe Engineering Pro E-Book  Electronic Book    ---  Available
Edition Second edition.
Description 1 online resource : illustrations
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Note Print version record.
Summary With a focus on statistically predicting failure and product yields, this book can help design, manufacturing and quality control engineers better understand the common mechanisms that lead to electronics materials failures, including dielectric
Bibliography Includes bibliographical references and index.
Subject Electronic apparatus and appliances -- Reliability.
System failures (Engineering)
Genre/Form Electronic books.
Added Author Kasprzak, Lucian, author.
Other Form: Print version: Ohring, Milton, 1936- Reliability and failure of electronic materials and devices London, UK : Academic Press is an imprint of Elsevier, [2015] 9780120885749 (DLC)2014031265
ISBN 9780080575520 (ebook)
9780120885749 (hardback)

 
    
Available items only