| Edition |
2nd ed. |
| Description |
1 online resource (422 pages) |
|
text txt rdacontent |
|
computer c rdamedia |
|
online resource cr rdacarrier |
| Series |
Micro and Nano Technologies |
|
Micro & nano technologies.
|
| Note |
Print version record. |
| Contents |
Intro; Title page; Table of Contents; Copyright; List of Contributors; Preface to the Second Edition; Preface to the First Edition; Chapter 1: Motivation; Abstract; 1.1. Why â#x80;#x9C;Quantitativeâ#x80;#x9D; Scanning Probe Microscopy?; 1.2. What Is Scanning Probe Microscopy?; 1.3. Basic Metrology Concepts; 1.4. Scanning Probe Microscopy and Quantitative Measurements; References; Chapter 2: Instrumentation Principles; Abstract; 2.1. Few Components for a Price of a House?; 2.2. Novel Approaches; References; Chapter 3: Data Models; Abstract; 3.1. From Analog to Digital; 3.2. Data Acquisition Basics |
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3.3. Image Sampling3.4. Data Storage; 3.5. Mechanical and Thermal Drifts; 3.6. Noise; 3.7. Try It Yourself; 3.8. Tips and Tricks; References; Chapter 4: Basic Data Processing; Abstract; 4.1. A Daily Bread?; 4.2. Data Visualization; 4.3. Local Data Manipulation; 4.4. Global Data Manipulation; 4.5. Multiple Channel Operations; 4.6. Scripting; 4.7. Data Generation; 4.8. Other Freely Available Data Processing Software; 4.9. Uncertainty Related to Data Processing; 4.10. Try It Yourself; 4.11. Tips and Tricks; References; Chapter 5: Dimensional Measurements; Abstract; 5.1. The Easiest Measurement? |
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5.2. Atomic Force Microscopy Principles5.3. Atomic Force Microscopy Dimensional Data Measurement and Evaluation; 5.4. Atomic Force Microscopy and Quantitative Dimensional Metrology; 5.5. Try It Yourself; 5.6. Tips and Tricks; References; Chapter 6: Force and Mechanical Properties; Abstract; 6.1. What About Forces in Force Microscopy?; 6.2. Forces and Forceâ#x80;#x93;Distance Curves; 6.3. Force Interaction Modeling; 6.4. Quantitative Force Measurements; 6.5. Local Mechanical and Material Properties Mapping; 6.6. Try It Yourself; 6.7. Tips and Tricks; References; Chapter 7: Friction and Lateral Forces |
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Abstract7.1. What Opposes the Tip Motion?; 7.2. Friction Forces; 7.3. Force Modeling; 7.4. Quantitative Friction Force Measurements; 7.5. Special Modes; 7.6. Try It Yourself; 7.7. Tips and Tricks; References; Chapter 8: Electrostatic Fields; Abstract; 8.1. What Is Above the Sample? See the Invisible!; 8.2. Basic Relations; 8.3. Numerical Modeling; 8.4. Try It Yourself; 8.5. Tips and Tricks; References; Chapter 9: Magnetic Fields; Abstract; 9.1. Magnetic Field Measurements; 9.2. Try It Yourself; 9.3. Tips and Tricks; References; Chapter 10: Local Current Measurements; Abstract |
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10.1. Where It All Started10.2. Tipâ#x80;#x93;Sample Junction Models; 10.3. Scanning Tunneling Microscopy and Related Methods; 10.4. Conductive Atomic Force Microscopy; 10.5. Piezoresponse Force Microscopy; 10.6. Scanning Electrochemical Microscopy; 10.7. Try It Yourself; 10.8. Tips and Tricks; References; Chapter 11: Thermal Measurements; Abstract; 11.1. Really a Hot Topic?; 11.2. Nano- and Microscale Heat Flow; 11.3. Instrumentation; 11.4. Data Interpretation; 11.5. Try It Yourself; 11.6. Tips and Tricks; References; Chapter 12: Optical Measurements; Abstract; 12.1. Have a Look at Nanoscale |
| Note |
12.2. Fundamental Phenomena |
| Bibliography |
Includes bibliographical references and index. |
| Summary |
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading for particular physical quantities measurements. Each chapter has been revised and updated for this new edition to reflect the progress that has been made in SPM techniques in recent years. New features for this edition include more step-by-step examples, better sample data and more links to related documentation in open source software. Scanning Probe Microscopy (SPM) techniques have the potential to produce information on various local physical properties. Unfortunately, there is still a large gap between what is measured by commercial devices and what could be considered as a quantitative result. This book determines to educate and close that gap. Associated data sets can be downloaded from http://gwyddion.net/qspm. |
| Subject |
Scanning probe microscopy.
|
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Nanostructures -- Measurement.
|
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Microscopy, Scanning Probe |
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Microscopie à sonde à balayage.
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SCIENCE -- General.
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Scanning probe microscopy
|
| Other Form: |
Print version: Klapetek, Petr. Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology. San Diego : Elsevier Science, ©2018 9780128133477 |
| ISBN |
9780128133484 |
|
0128133481 |
|
0128133473 |
|
9780128133477 |
| Standard No. |
AU@ 000061486777 |
|
UKMGB 018646463 |
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AU@ 000068485624 |
|
