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Title
Terrestrial neutron-induced soft errors in advanced memory devices [electronic resource] / Takashi Nakamura ... [et al.].
Imprint
Hackensack, NJ : World Scientific, c2008.
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Available to Pittsburg State University patrons only.
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Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
xxii, 343 p. : ill. (some col.)
Bibliography
Includes bibliographical references (p. 291-315) and index.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject
Semiconductor storage devices.
Neutron irradiation.
Radiation dosimetry.
Nuclear physics.
Genre/Form
Electronic books.
Added Author
Nakamura, Takashi, 1939-
ProQuest (Firm)
ISBN
9789812778819
9812778810
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