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Author
Servin, Manuel, author.
Title
Fringe pattern analysis for optical metrology : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
Publication Info.
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
2014
Connect to
Available to Pittsburg State University patrons only.
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Location
Call No.
OPAC Message
Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
1 online resource (345 pages) : illustrations
text rdacontent
computer rdamedia
online resource rdacarrier
Bibliography
Includes bibliographical references and index.
Note
Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).
Subject
Diffraction patterns -- Data processing.
Image processing -- Data processing.
Genre/Form
Electronic books.
Added Author
Quiroga, J. Antonio, author.
Padilla, J. Moises, author.
Other Form:
Print version: Servin, Manuel. Fringe pattern analysis for optical metrology : theory, algorithms, and applications. Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, c2014 xvi, 327 pages 9783527411528
ISBN
9783527411528
9783527681099 (Mobi)
9783527681075 (oBook)
9783527681082 (electronic bk.)
9783527681105 (electronic bk.)
Available items only
