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Title Beam effects, surface topography, and depth profiling in surface analysis [electronic resource] / edited by Alvin W. Czanderna, Theodore E. Madey and Cedric J. Powell.

Imprint New York : Plenum Press, c1998.


Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Description xix, 430 p. : ill.
Series Methods of surface characterization ; v. 5
Methods of surface characterization ; v. 5.
Bibliography Includes bibliographical references and index.
Reproduction Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject Surfaces (Technology) -- Analysis.
Materials -- Effect of radiation on.
Genre/Form Electronic books.
Added Author Czanderna, Alvin Warren, 1930-
Madey, Theodore E.
Powell, C. J. (Cedric John)
ProQuest (Firm)
ISBN 0306458969

Available items only