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Electronic Book
Author Roll, Guntrade, author.

Title Leakage current and defect characterization of short channel MOSFETs / Guntrade Roll.

Publication Info. Berlin : Logos Verlag Berlin, [2014]
2014

Copies

Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Description 1 online resource (242 pages).
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series Research at NaMLab ; 2
Note Description based on print version record.
Subject Metal oxide semiconductor field-effect transistors.
Genre/Form Electronic books.
Other Form: Print version: Roll, Guntrade. Leakage current and defect characterization of short channel MOSFETs. Berlin : Logos Verlag Berlin, c2014 242 pages Research at NaMLab ; 2 9783832532611
ISBN 9783832532611
9783832596668 (electronic bk.)

 
    
Available items only