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Author
Rumiantsev, Andrej, author.
Title
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / Andrej Rumiantsev.
Publication Info.
Gistrup, Denmark ; Delft, Netherlands : River Publishers, [2019]
2019
Connect to
Available to Pittsburg State University patrons only.
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Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
1 online resource (278 pages).
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Series
River publishers series in electronic materials and devices
River Publishers series in electronic materials and devices.
Note
Description based on print version record.
Subject
Semiconductors -- Characterization.
Genre/Form
Electronic books.
Other Form:
Print version: Rumiantsev, Andrej. On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond. Gistrup, Denmark ; Delft, Netherlands : River Publishers, c2019 278 pages River publishers series in electronic materials and devices. 9788770221122
ISBN
9788770221122
9788770221115 (e-book)
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