Description |
1 online resource (11 p.) : digital, PDF file |
Series |
NREL/CP ; 520-47463 |
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Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-520-47463.
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Note |
Title from title screen (viewed Aug. 30, 2010). |
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"August 2010." |
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"To be presented at SPIE 2010 Optics and Photonics Conference, San Diego, California, August 1-5, 2010." |
Bibliography |
Includes bibliographical references (p. 11). |
Summary |
The degradation in performance for eight photovoltaic (PV) modules stressed at high voltage (HV) is presented. Four types of modules -- tandem-junction and triple-junction amorphous thin-film silicon, plus crystalline and polycrystalline silicon modules -- were tested, with a pair of each biased at opposite polarities. They were deployed outdoors between 2001 and 2009 with their respective HV leakage currents through the module encapsulation continuously monitored with a data acquisition system, along with air temperature and relative humidity. For the first 5 years, all modules were biased continuously at fixed 600 VDC, day and night. In the last 2 years, the modules were step-bias stressed cyclically up and down in voltage between 10 and 600 VDC, in steps of tens to hundreds of volts. This allowed characterization of leakage current versus voltage under a large range of temperature and moisture conditions, facilitating determination of leakage paths. An analysis of the degradation is presented, along with integrated leakage charge. In HV operation: the bulk silicon modules degraded either insignificantly or at rates of 0.1%/yr higher than modules not biased at HV; for the thin-film silicon modules, the added loss rates are insignificant for one type, or 0.2%/yr-0.6%/yr larger for the other type. |
Subject |
Photovoltaic cells -- Testing.
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Solar cells -- Research.
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Added Author |
Rummel, Steve.
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National Renewable Energy Laboratory (U.S.)
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Other Form: |
Paper version: Cueto, J. A. del. Degradation of photovoltaic modules under high voltage stress in the field. 11 p. (OCoLC)670223381 |
Gpo Item No. |
0430-P-04 (online) |
Sudoc No. |
E 9.17:NREL/CP-520-47463 |
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