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Conference

International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)

Title Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

Publication Info.	Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
	2012

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Copies

Location	Call No.	OPAC Message	Status
Axe ProQuest E-Book	Electronic Book	---	Available

Description	1 online resource (300 pages).
	text rdacontent
	computer rdamedia
	online resource rdacarrier
Series	Materials science forum ; vol. 725
	Materials science forum ; v. 725.
Note	Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
Subject	Semiconductors -- Defects -- Congresses.
	Physics -- Congresses.
Genre/Form	Electronic books.
Added Author	Yamada-Kaneta, Hiroshi.
	Sakai, Akira (Professor of engineering science)
ISBN	9783037854426 (pbk.)
	9783038138563 (electronic bk.)