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Authors (1-3 of 3)
Stroud Charles E
1
A designer's guide to built-in self-test
Stroud, Charles E.
Boston : Kluwer Academic Publishers, c2002. 2002
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Axe ProQuest E-Book
Electronic Book
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2
System-on-chip test architectures nanometer design for testability
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008. 2008
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Axe ProQuest E-Book
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3
System-on-chip test architectures : nanometer design for testability
Amsterdam ; Boston : Morgan Kaufmann Publishers, ©2008. 2008
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Axe Elsevier ScienceDirect Ebook
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