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Author
Tabrizi, Mahmood T.
Title
X-ray integrated intensity measurements of silicon using a two beam double crystal spectrometer / by Mahmood T. Tabrizi.
Imprint
Pittsburg, Ks. : Pittsburg State University, 1978.
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Location
Call No.
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Status
Axe PSU Archives Thesis/Problems
546.6836 T116x
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Lib Use Only
Axe Thesis 3rd Floor
546.6836 T116x
c.2
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Available
Description
vi, 35 leaves : ill. ; 28 cm.
Thesis
Thesis (M.S.)--Pittsburg State University, 1978.
Bibliography
Bibliography: p. 35.
Subject
Silicon -- Spectra.
X-ray crystallography.
Interferometers.
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