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Author Bowen, D. Keith (David Keith), 1940-

Title High resolution X-ray diffractometry and topography / D. Keith Bowen and Brian K. Tanner.

Imprint London ; Bristol, PA : Taylor & Francis, c1998.


Location Call No. OPAC Message Status
 Axe 2nd Floor Stacks  548.83 B675h    ---  Available
Description x, 252 p. : ill. ; 28 cm.
Bibliography Includes bibliographical references and index.
Subject X-ray crystallography.
X-rays -- Diffraction.
Added Author Tanner, B. K. (Brian Keith)
ISBN 0850667585

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