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Author

Title Medium-range order in amorphous silicon measured by fluctuation electron microscopy [electronic resource] : final report, 23 June 1999-23 August 2002 / P.M. Voyles and J.R. Abelson.

Imprint

Golden, Colo. : National Renewable Energy Laboratory, [2003]

Connect to
Connect to https://www.nrel.gov/docs/fy04osti/34826.pdf

Copies

Location	Call No.	OPAC Message	Status
Axe Federal Documents Online	E 9.18:NREL/SR-520-34826	---	Available

Series	NREL/SR ; 520-34826
System Details	Mode of access: Internet from the NREL web site.
Note	Title from title screen (viewed on June 7, 2004).
Subject	Amorphous semiconductors.
Added Author	Abelson, John Robert.
	National Renewable Energy Laboratory (U.S.)
Other Form:	Voyles, Paul Marriner, 1974- Medium-range order in amorphous silicon measured by fluctuation electron microscopy iv, 30 p. (OCoLC)53970012
Gpo Item No.	0430-P-05 (online)
Sudoc No.	E 9.18:NREL/SR-520-34826