Description |
1 online resource |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
Note |
Includes index. |
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Print version record. |
Contents |
Front Cover; ATOM PROBE TOMOGRAPHY#; ATOM PROBE TOMOGRAPHY PUT THEORY INTO PRACTICEED; Copyright; CONTENTS; CONTRIBUTORS; PREFACE; LIST OF ABBREVIATIONS; One -- Early Developments and Basic Concepts; Two -- Field Ion Emission Mechanisms; Three -- Basics of Field Ion Microscopy; Four -- Atom Probe Sample Preparation; Five -- Time-of-Flight Mass Spectrometry and Composition Measurements; Six -- Atom Probe Tomography: Detector Issues and Technology; Seven -- Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches; Eight -- Laser-Assisted Field Evaporation. |
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Nine -- Data MiningTen -- Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography; Eleven -- Combining Atom Probe Tomography and Optical Spectroscopy; A; B; INDEX; Back Cover; INTRODUCTION; ATOM PROBE TOMOGRAPHY IN MATERIALS SCIENCE TODAY; BASIC CONCEPTS; CONCLUDING REMARKS, THE SPECIFICITIES OF ATOM PROBE TOMOGRAPHY; REFERENCES; INTRODUCTION; FIELD GENERATION AT THE SURFACE OF A FIELD EMITTER; FIELD EMISSION AT THE TIP SURFACE FROM ELECTRON EMISSION TO FIELD EVAPORATION; TRAJECTORIES OF IONS AFTER IONIZATION OR FIELD EVAPORATION IN THE ATOM PROBE. |
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Conclusionreferences; introduction; basic principles; field ion microscopy in materials science; conclusion; references; specimen preparation by electropolishing; sample preparation using focused ion beam milling; conclusions; references; introduction; general concepts and definitions; optimizing the mass spectrum in atom probe tomography; extracting information from mass spectra; references; introduction; microchannel plate assembly; conventional delay line detector; conventional measure of timing information; accuracy of conventional delay line detector for single events. |
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Coevaporation effectaccuracy of conventional delay line detector for multiple events; advanced delay line detector; influence of detection systems performances on low-angle atom probe accuracy; influence of detection systems on atom probe accuracy in wide-angle ap; effect of multiple events detection on composition; conclusion; references; classical methods of tomographic reconstruction; a few words on metrological performances and terminology; spatial precision; improving spatial accuracy of apt images; conclusions and perspectives; references; introduction. |
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Historical background of field evaporation assisted by laser pulsesoptical properties of nano tips; physical mechanisms of field evaporation assisted by laser pulses; consequences on the la-apt performances; conclusions and perspectives; references; preliminary definitions; building the tools; relevance of the approach as a function of the feature of interest; identifying the bias; conclusion; references; motivations for a correlative approach; relevant techniques for a correlative approach; experimental protocols; degradation of specimen due to observation in stem. |
Bibliography |
Includes bibliographical references at the end of each chapters and index. |
Subject |
Tomography.
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Tomographie.
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TECHNOLOGY & ENGINEERING -- Engineering (General)
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TECHNOLOGY & ENGINEERING -- Reference.
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Tomography
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Added Author |
Lefebvre-Ulrikson, Williams.
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Vurpillot, François.
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Sauvage, Xavier.
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Other Form: |
Print version: Lefebvre, Williams. Atom Probe Tomography : Put Theory Into Practice. : Elsevier Science, ©2016 9780128046470 |
ISBN |
0128047453 (electronic bk.) |
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9780128047453 (electronic bk.) |
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9780128046470 |
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0128046473 |
Standard No. |
AU@ 000058965885 |
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CHBIS 010796304 |
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CHVBK 403939577 |
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DEBSZ 482471123 |
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GBVCP 879396423 |
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UKMGB 017975374 |
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