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Title
VLSI test principles and architectures [electronic resource] : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.
Imprint
Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
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Available to Pittsburg State University patrons only.
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Call No.
OPAC Message
Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
xxx, 777 p. : ill. ; 25 cm.
Series
The Morgan Kaufmann series in systems on silicon
Morgan Kaufmann series in systems on silicon.
Bibliography
Includes bibliographical references and index.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject
Integrated circuits -- Very large scale integration -- Testing.
Integrated circuits -- Very large scale integration -- Design.
Genre/Form
Electronic books.
Added Author
Wang, Laung-Terng.
Wu, Cheng-Wen, EE Ph. D.
Wen, Xiaoqing.
ISBN
0123705975 (hardcover : alk. paper)
9780123705976
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