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Conference International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (14th : 2011 : Miyazaki-shi, Japan)

Title Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011. Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

Publication Info. Durnten-Zurich ; Enfield, NH : Trans Tech Publications, [2012]
2012

Copies

Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Description 1 online resource (300 pages).
text rdacontent
computer rdamedia
online resource rdacarrier
Series Materials science forum ; vol. 725
Materials science forum ; v. 725.
Note Description based on online resource; title from PDF title page (ebrary, viewed October 31, 2013).
Subject Semiconductors -- Defects -- Congresses.
Physics -- Congresses.
Genre/Form Electronic books.
Added Author Yamada-Kaneta, Hiroshi.
Sakai, Akira (Professor of engineering science)
ISBN 9783038138563 (e-book)
9783037854426 (pbk.)

 
    
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