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Author
Hosmer, David W.
Title
Applied logistic regression / David W. Hosmer, Jr., Stanley Lemeshow.
Imprint
New York : Wiley, c1989.
Copies
Location
Call No.
OPAC Message
Status
Axe 2nd Floor Stacks
519.536 H794a
---
Available
Description
xiii, 307 p. ; 24 cm.
Series
Wiley series in probability and mathematical statistics.
Note
"A Wiley-Interscience publication."
Bibliography
Includes bibliographical references (p. 291-300) and index.
Subject
Regression analysis.
Added Author
Lemeshow, Stanley.
ISBN
0471615536
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