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Title |
Characterization of thin films of cadmium telluride using x-ray diffraction techniques / by Derek D. Eshelbrenner. |
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Imprint |
Pittsburg, Kan. : Pittsburg State University, 1987. |
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Description |
102 leaves : ill. (some col.) ; 29 cm. |
Thesis |
Thesis (M. S.)--Pittsburg State University, 1987. |
Bibliography |
Bibliography: leaves 97-102. |
Subject |
X-rays -- Diffraction.
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Cadmium crystals.
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