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Author Adams, R. Dean.

Title High performance memory testing [electronic resource] : design principles, fault modeling, and self-test / R. Dean Adams.

Imprint Boston : Kluwer Academic, c2003.

Copies

Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Description xiii, 246 p. : ill.
Series Frontiers in electronic testing
Frontiers in electronic testing.
Bibliography Includes bibliographical references (p. [229]-239) and index.
Reproduction Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject Semiconductor storage devices -- Testing.
Computer storage devices -- Testing.
Genre/Form Electronic books.
Added Author ProQuest (Firm)
ISBN 1402072554 (alk. paper)

 
    
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