Welcome to the Kids' Library!

Demystifying mixed-signal test methods

Baker, Mark.
Amsterdam ; Boston : Newnes, ©2003. 2003

Design for at-speed test, diagnosis, and measurement

Boston : Kluwer Academic, c2000. 2000

A designer's guide to built-in self-test

Stroud, Charles E.
Boston : Kluwer Academic Publishers, c2002. 2002

Diagnosis & reliable design of digital systems

Breuer, Melvin A.
Woodland Hills, Calif. : Computer Science Press, c1976. 1976

Environmental requirements for electromechanical and electronic equipment

Tricker, Ray.
Oxford [England] ; Boston : Newnes, 1999. 1999

How to use signal generators in the laboratory

Lenk, John D.
New York, N.Y. : Rider, [1967] 1967

Build your own electronics workshop

Petruzzellis, Thomas.
New York : McGraw-Hill, c2005. 2005

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analys

International Symposium for Testing and Failure Analysis (37th : 2011 : San Jose, Calif.)
Materials Park, Ohio : ASM International, 2011. 2011

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Anal

International Symposium for Testing and Failure Analysis (38th : 2012 : Phoenix Convention Center)
Materials Park, Ohio : ASM International, 2012. 2012

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure An

International Symposium for Testing and Failure Analysis (40th : 2014 : Houston, Tex.)
Materials Park, Ohio : ASM International, 2014. 2014

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Anal

International Symposium for Testing and Failure Analysis (41st : 2015 : Portland, Oregon), organizer.
Materials Park, Ohio : ASM International, [2015] 2015

Electronic troubleshooting & servicing techniques

Wilson, J. A. Sam.
Indianapolis, Ind. : Prompt Publications, 1998- 1998

Basic electronic test equipment : a programmed introduction

Schuster, Donald H.
New York, N.Y. : McGraw-Hill, [1968] 1968