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Author Gray, Kirk, author.

Title Next generation HALT and HASS : robust design of electronics and systems / Kirk Gray, John James Paschkewitz.

Publication Info. Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016.

Copies

Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Description 1 online resource (299 pages) : illustrations (some color)
text rdacontent
computer rdamedia
online resource rdacarrier
Series Wiley series in quality and reliability engineering
Wiley series in quality and reliability engineering.
Bibliography Includes bibliographical references and index.
Contents Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
Note Description based on print version record.
Reproduction Electronic reproduction. Ann Arbor, MI : ProQuest, 2016. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject Accelerated life testing.
Electronic systems -- Design and construction.
Electronic systems -- Testing.
Genre/Form Electronic books.
Added Author Paschkewitz, John James, author.
Other Form: Print version: Gray, Kirk. Next generation HALT and HASS : robust design of electronics and systems. Chichester, West Sussex, United Kingdom : Wiley, 2016 Wiley series in quality and reliability engineering 9781118700228
ISBN 9781118700235 (cloth)
9781118700228
9781118700204 (e-book)

 
    
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