| Edition |
1st ed. |
| Description |
1 online resource (xx, 296 pages, 4 unnumbered pages of plates) : illustrations (some color), maps. |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics, 1076-5670 ; v. 160
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| Bibliography |
Includes bibliographical references and index. |
| Summary |
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. * Contributions from leading international scholars and industry experts * Discusses hot topic areas and presents current and future research trends * Invaluable reference and guide for physicists, engineers and mathematicians. |
| Note |
Print version record. |
| Contents |
Front Cover; Advances in Imaging and Electron Physics; Copyright Page; Contents; Preface; Contributors; Future Contributions; Chapter 1: Gamut Mapping; 1. Introduction; 1.1. Scope of this Chapter; 2. Fundamentals of Color Science; 2.1. Human Vision; 2.2. Color Spaces; 2.3. RGB and XYZ Color Spaces; 2.4. CIELAB Color Space; 2.5. Color and Image Appearance; 3. Gamut Mapping in the Image Reproduction Process; 3.1. Model of Visual Image Perception in the Reproduction Environment; 3.2. Color Management?; 4. Psychometrics; 4.1. Test Methods; 4.2. Data Evaluation; 5. Image Quality Measures |
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5.1. Mean Square Error5.2. The Measure QDeltaE; 5.3. Laplacian Mean Square Error; 5.4. The Measure QDeltaLC; 5.5. Structural Similarity Index; 5.6. Comparing Models; 6. Gamut Mapping as an Optimization Problem; 6.1. Abstract Optimization Problem; 6.2. Concrete Objective Functions and Constraints; 7. Conclusion and Future Work; References; Chapter 2: Color Area Morphology Scale-Spaces; 1. Introduction; 2. Area Openings and Closings; 3. Area Morphology Scale-Spaces; 4. Color Connected Filters; 4.1. Color Area Morphology Scale-Spaces; 4.2. Convex Color Sieve; 4.3. Vector Area Morphology Sieve |
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4.4. Vector Area Morphology Open-Close Sieve5. Performance Evaluation; 5.1. Implementation and Timings; 5.2. Application to Image Segmentation; 5.3. Robustness to Noise; 6. Conclusions; Acknowledgments; References; Chapter 3: Harmonic Holography; 1. Introduction; 2. Scattering of Optical Second Harmonics; 2.1. SHG Compared with Two-Photon Fluorescence; 2.2. Differences between Bulk and Nanoscale Harmonic Generations; 2.3. Emission Power and Scattering Cross Section of Nanoscale SHG; 3. Principle of Harmonic Holography; 3.1. Coherence of Optical Harmonics; 3.2. Harmonic Holography |
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3.3. Performance Estimation3.4. Holography with Other Types of Nonlinear Emissions; 4. Three-Dimensional Microscopy of Cells with Harmonic Holography; 5. Future Developments; 6. Conclusion; References; Chapter 4: Lattice Algebra Approach to Endmember Determination in Hyperspectral Imagery; 1. Introduction; 2. Basic Concepts from Lattice Theory; 3. Properties of LAMs; 4. LAMs and Endmembers; 5. Application Examples and Results; 6. The Geometry of F(X); 7. Relationships Among X, WXX, MXX, and F(X); 8. Prelude to Affine Independence; 9. Affine-Independent Sets derived from W and M |
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10. Conclusions and Discussion11. Appendix: Theorem Proofs; References; Chapter 5: Origin and Background of the Invention of the Electron Microscope; 1. Introduction; 2. Cathode Ray Tubes in Evolution; 3. My Own Career; 4. A Case of Infantile Paralysis; 5. Limitations of Optical Microscopes; 6. Realization of the Electron Microscope; 7. Fate of the Invention; 8. Building of the Instrument; References; Chapter 6: Origin and Background of the Invention of the Electron Microscope: Commentary and Expanded Notes on Memoir of Reinhold Ruumldenberg; 1. Introduction; 2. Early Life |
| Subject |
Electrons.
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Electronics.
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Imaging systems.
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Électrons.
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Électronique.
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Imagerie (Technique)
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electronic engineering.
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TECHNOLOGY & ENGINEERING -- Electronics -- Optoelectronics.
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Electronics
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Electrons
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Imaging systems
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| Added Author |
Hawkes, P. W.
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| Other Form: |
Print version: Advances in imaging and electron physics. Volume 160. Amsterdam ; Boston, Mass. : Academic Press, ©2010 9780123810175 (OCoLC)489631527 |
| ISBN |
9780123810182 (electronic bk.) |
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0123810183 (electronic bk.) |
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9780123810175 (electronic bk.) |
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0123810175 (electronic bk.) |
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1283169258 |
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9781283169257 |
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9786613169259 |
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6613169250 |
| Standard No. |
CHBIS 010355201 |
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CHVBK 329763326 |
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DEBSZ 405337957 |
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AU@ 000056831805 |
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