| Description |
1 online resource (xv, 310 pages) : illustrations. |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; v. 141
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| Bibliography |
Includes bibliographical references and index. |
| Summary |
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.-Includes grey systems and grey information -Discusses Phase diversity -Recent developments in the imaging of magnetic domains -Explores stochastic deconvolution over groups. |
| Note |
Print version record. |
| Contents |
Front cover; Title page; Copyright; Table of contents; Front matter; Contributors; Preface; Future Contributions; Body; Phase Diversity: A Technique for Wave-Front Sensing and for Diffraction-Limited Imaging; Introduction and Problem Statement; Context; Image Formation; PSF of a Telescope; Origin of PSF Degradations: Intrinsic Aberrations; Origin of PSF Degradations: Atmospheric Turbulence; Astronomical observation from the ground; Earth observation from Space; Parameterization of the Phase; Discrete Image Model; Basics of Phase Diversity; Uniqueness of the Phase Estimate |
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Inverse Problems at HandApplications of Phase Diversity; Quasi-Static Aberration Correction of Optical Telescopes; Monolithic-Aperture Telescope Calibration; Space-based telescopes; Ground-based telescopes; Cophasing of Multiaperture Telescopes; Diffraction-Limited Imaging Through Turbulence; A posteriori Correction; Real-Time Wave-Front Correction; Phase Estimation Methods; Joint Estimator; Joint Criterion; Noise; Object prior probability distribution; Phase prior probability distribution; Criterion; Expression of o; Circulant Approximation and Expression in Fourier Domain |
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Tuning of the HyperparametersNoise; Aberrations; Object; Marginal Estimator; Expression of RI-1; Determinant of RI; Marginal Criterion; Relationship Between the Joint and the Marginal Criteria; Expression in the Fourier Domain; Unsupervised Estimation of the Hyperparameters; Extended Objects; Apodization; Guard Band; Joint estimator; Marginal estimator; Properties of the Phase Estimation Methods; Image Simulation; Asymptotic Properties of the Two Estimators for Known Hyperparameters; Joint Estimation: Influence of the Hyperparameters; Marginal Estimation: Unsupervised Estimation |
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Performance ComparisonConclusion; Restoration of the Object; With the Joint Method; With the Marginal Method; Principle; Results; Influence of the Hyperparameters; With a ""Hybrid"" Method; Principle; The Three Steps; Results; Conclusion; Optimization Methods; Projection-Based Methods; Line-Search Methods; Strategies of Search Direction; Step Size Rules; Trust-Region Methods; Application of Phase Diversity to an Operational System: Calibration of NAOS-CONICA; Practical Implementation of Phase Diversity; Choice of the Defocus Distance; Image Centering; Spectral Bandwidth |
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Calibration of NAOS and CONICA Static AberrationsThe Instrument; Calibration of CONICA Stand-Alone; Phase diversity setup; Example of CONICA aberration estimation; Calibration of the filters and objectives; Calibration of the NAOS Dichroics; Phase-diversity setup; Calibration of NAOS dichroic aberrations; Closed-Loop Compensation; Conclusion; Emerging Methods: Measurement of Large Aberrations; Problem Statement; Large Aberration Estimation Methods; Estimation of the Unwrapped Phase; Zernike polynomials; Delta functions; Estimation of the Wrapped Phase (Then Unwrapping) |
| Language |
English. |
| Subject |
Electronics.
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Imaging systems.
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Image processing.
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Electronics |
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Électronique.
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Imagerie (Technique)
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Traitement d'images.
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image processing.
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Electronics
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Image processing
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Imaging systems
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| Added Author |
Hawkes, P. W.
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| Other Form: |
Print version: Advances in imaging and electron physics. San Diego : Academic Press, ©2006 (DLC) 94004375 |
| ISBN |
0120147831 (electronic bk.) |
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9780120147830 (electronic bk.) |
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9780120147830 |
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0080462782 |
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1280641223 |
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9781280641220 |
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9786610641222 |
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6610641226 |
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9780080462783 |
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0080462782 |
| Standard No. |
NZ1 13078137 |
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CHBIS 010355182 |
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CHVBK 329757857 |
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DEBSZ 405325320 |
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YDXCP 2401019 |
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GBVCP 825872332 |
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AU@ 000069746263 |
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