| Description |
1 online resource (xv, 416 pages) : illustrations |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Series |
Advances in imaging and electron physics ; v. 107
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| Bibliography |
Includes bibliographical references and index. |
| Note |
Print version record. |
| Summary |
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
| Contents |
Front Cover; Advances in Imaging and Electron Physics, Volume 107; Copyright Page; Contents; Contributors; Preface; Chapter 1. Magneto-Transport as a Probe of Electron Dynamics in Open Quantum Dots; I. Introduction; II. Magneto-Transport in Open Quantum Dots: Some Theoretical Considerations; III. Weak-Field Magneto-Transport in Open Quantum Dots: Low-Temperature Properties; IV. Weak-Field Magneto-Transport in Open Quantum Dots: High-Temperature Properties; V. High-Field Magneto-Transport in Open Quantum Dots; VI. Concluding Discussion; References |
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Chapter 2. External Optical Feedback Effects in Distributed Feedback Semiconductor LasersI. Introduction; II. Distributed Feedback Laser Fundamentals; III. Experimentally Observed Effects; IV. Theories on Optical Feedback; V. External Optical Feedback Sensitivity; VI. Conclusion; References; Chapter 3. Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images; I. Introduction; II. Strain-State Analysis; III. Composition Evaluation by Lattice Fringe Analysis; IV. Applications; V. Summary and Discussion of the Atomic Scale Analysis Methods |
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Appendix A: List of VariablesChapter 4. Hexagonal Sampling in Image Processing; I. Introduction; II. Image Sampling on a Hexagonal Grid; III. Processor Architecture; IV. Binary Image Processing.; V. Monochrome Image Processing; VI. Conclusions; References; Chapter 5. The Group Representation Network: A General Approach to Invariant Pattern Classification; I. Pattern Classification and the Invariance Problem; II. Group Representation Theory; III. Linear and Nonlinear Concomitants; IV. Adaptivity in Group Representation Networks; V. Practical Considerations and Simulations |
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VI. The Computational Power of the Group Representation Network ModelVII. The Group Representation Network and Other Invariant Classification Methods; VIII. Summary and Open Questions; Proof of Theorem III. 1; References; Index |
| Language |
English. |
| Subject |
Electrons.
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Electron microscopes.
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Image processing.
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Electronics.
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Électrons.
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Microscopes électroniques.
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Traitement d'images.
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Électronique.
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image processing.
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electronic engineering.
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SCIENCE -- Physics -- Electromagnetism.
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SCIENCE -- Physics -- Electricity.
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Electron microscopes
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Electronics
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Electrons
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Image processing
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Fisica geral.
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| Added Author |
Hawkes, P. W.
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| Other Form: |
Print version: Advances in imaging and electron physics. Volume 107. San Diego ; London : Academic Press, ©1999 0120147491 9780120147496 (OCoLC)41398130 |
| ISBN |
9780080577739 (electronic bk.) |
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0080577733 (electronic bk.) |
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0120147491 (electronic bk.) |
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9780120147496 (electronic bk.) |
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1281719021 |
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9781281719027 |
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9786611719029 |
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6611719024 |
| Standard No. |
AU@ 000067741788 |
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CHBIS 010355149 |
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CHVBK 329746650 |
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DEBSZ 405322909 |
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DEBSZ 482445580 |
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