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ElectronicResource GovDoc
Author Snyder, Chad R.

Title Capacitance cell measurement of the out-of-plane expansion of thin films [electronic resource] / Chad R. Snyder, Frederick I. Mopsik.

Imprint [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2001]

Copies

Location Call No. OPAC Message Status
 Axe Federal Documents Online  C 13.10:960-7    ---  Available
Description 1 online resource (x, 32 p.) : ill.
Series NIST special publication ; no. 960-7
NIST recommended practice guide
NIST recommended practice guide.
NIST special publication ; no. 960-7.
Note Title from title screen (viewed Apr. 19, 2011).
"November 2001."
Bibliography Includes bibliographical references (p. 31-32).
Note "CODEN: NSPUE2."
Subject Thin-film circuits.
Thin films -- Thermal properties.
Expansion (Heat) -- Measurement.
Added Author Mopsik, Frederick I.
National Institute of Standards and Technology (U.S.)
Other Form: Paper version: Snyder, Chad R. Capacitance cell measurement of the out-of-plane expansion of thin films. (OCoLC)52343080
Gpo Item No. 0247 (online)
Sudoc No. C 13.10:960-7

 
    
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