Welcome to the Kids' Library!
Search for books, movies, music, magazines, and more.
Your session will expire automatically in
0
seconds.
Continue session
End session now
Back to Search Results
SearchType
Keyword
Author
Title
Subject
Call Number
Search
Search Scope
PSU Library Consortium
Pittsburg State University
Academic Libraries
Public Libraries
Pittsburg Area
Unified School District
Leonard H. Axe Library
Career Resource Center Library
Eureka Public Library
Fort Scott Community College Library
George Nettels Elementary School Library
Kansas Technology Center Library
Lakeside Elementary School Library
Meadowlark Elementary School Library
Parsons Public Library
Pittsburg Community Middle School Library
Pittsburg High School Library
Pittsburg Public Library
Sedan Public Library
Westside Elementary School Library
Childrens Collection
Available items only
Previous Record
Next Record
Title
System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
Imprint
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Connect to
Available to Pittsburg State University patrons only.
Copies
Location
Call No.
OPAC Message
Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
xxxvi, 856 p. : ill.
Series
The Morgan Kaufmann series in systems on silicon
Morgan Kaufmann series in systems on silicon.
Bibliography
Includes bibliographical references and index.
Reproduction
Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject
Systems on a chip -- Testing.
Integrated circuits -- Very large scale integration -- Testing.
Integrated circuits -- Very large scale integration -- Design.
Genre/Form
Electronic books.
Added Author
Wang, Laung-Terng.
Stroud, Charles E.
Touba, Nur A.
ProQuest (Firm)
ISBN
9780123739735 (hardcover : alk. paper)
012373973X (hardcover : alk. paper)
Available items only
