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Integrated Circuits Testing
1
Electronic Book
 

Design for at-speed test, diagnosis, and measurement



Boston : Kluwer Academic, c2000. 2000

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2
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An engineer's guide to automated testing of high-speed interfaces


Moreira, Jose, 1975- author.
Norwood, Massachusetts : Artech House, 2016. 2016

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3
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ESD failure mechanisms and models


Voldman, Steven H.
Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. 2009

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4
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Principles of semiconductor network testing


Afshar, Amir.
Boston : Butterworth-Heinemann, ©1995. 1995

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 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
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