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Integrated Circuits Very Large Scale Integration Design
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System-on-chip test architectures nanometer design for testability



Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008. 2008

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 Axe ProQuest E-Book  Electronic Book    ---  Available
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System-on-chip test architectures : nanometer design for testability



Amsterdam ; Boston : Morgan Kaufmann Publishers, 2008. 2008

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Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
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