| Description |
1 online resource (xii, 128 pages) : illustrations |
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text txt rdacontent |
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computer c rdamedia |
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online resource cr rdacarrier |
| Note |
"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii |
| Summary |
This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots. |
| Bibliography |
Includes bibliographical references and index. |
| Contents |
Measurement Science and Manufacturing Science Research -- Nondestructive SEM for Surface and Subsurface Wafer Imaging -- Surface Inspection-Research and Development -- Wafer Level Reliability for High-Performance VLSI Design -- Wafer Level Reliability Testing: an Idea Whose Time Has Come -- Micro-Focus X-Ray Imaging -- Measurement of Opaque Film Thickness -- Intelligent Laser Soldering Inspection and Process Control -- Rupture Testing for the Quality Control of Electrodeposited Copper Interconnections in High-Speed, High-Density Circuits -- Heterodyne Holographic Interferometry: High-Resolution Ranging and Displacement Measurement -- Whole Wafer Scanning Electron Microscopy. |
| Access |
Use copy Restrictions unspecified star MiAaHDL |
| Reproduction |
Electronic reproduction. [Place of publication not identified] : HathiTrust Digital Library, 2010. MiAaHDL |
| System Details |
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL |
| Processing Action |
digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL |
| Note |
Print version record. |
| Language |
English. |
| Subject |
Integrated circuits -- Reliability -- Congresses.
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Nondestructive testing -- Congresses.
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Integrated circuits -- Testing -- Congresses.
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Circuits intégrés -- Fiabilité -- Congrès.
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Contrôle non destructif -- Congrès.
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TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
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TECHNOLOGY & ENGINEERING -- Electronics -- Digital.
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Integrated circuits -- Reliability.
(OCoLC)fst00975588
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Integrated circuits -- Testing.
(OCoLC)fst00975593
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Nondestructive testing. (OCoLC)fst01430903
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Elektronik
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Elektronische Schaltung
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Kongress
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Zuverlässigkeit
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| Genre/Form |
Conference papers and proceedings. (OCoLC)fst01423772
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Conference papers and proceedings.
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Actes de congrès.
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Hampton (Va., 1986)
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| Added Author |
Heyman, Joseph S.
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| Other Form: |
Print version: Electronics reliability and measurement technology. Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988 081551171X (DLC) 88025395 |
| ISBN |
1591240514 (electronic bk.) |
|
9781591240518 (electronic bk.) |
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9780815511717 |
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081551171X |
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9780815516996 (electronic bk.) |
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0815516991 (electronic bk.) |
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9780080944685 (e-book) |
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008094468X (e-book) |
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1282002295 |
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9781282002296 |
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9786612002298 |
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6612002298 |
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0815517009 |
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9780815517009 |
|
9780815517009 |
| Standard No. |
(WaSeSS)ssj0000071802 |
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AU@ 000025337007 |
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CHNEW 001004478 |
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DEBBG BV042315378 |
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DEBSZ 338255516 |
|
DEBSZ 405320884 |
|
GBVCP 878882774 |
|
NZ1 10240178 |
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NZ1 14676149 |
|
NZ1 15191235 |
|
NZ1 15627162 |
