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Author
Ibe, Eishi H., author.
Title
Terrestrial radiation effects in ULSI devices and electronic systems / Eishi H. Ibe.
Publication Info.
Singapore : IEEE : Wiley, 2015.
2015
Connect to
Available to Pittsburg State University patrons only.
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Location
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OPAC Message
Status
Axe ProQuest E-Book
Electronic Book
---
Available
Description
1 online resource (295 pages) : illustrations
text rdacontent
computer rdamedia
online resource rdacarrier
Bibliography
Includes bibliographical references at the end of each chapters and index.
Note
Description based on print version record.
Subject
Electronic circuits -- Effect of radiation on.
Integrated circuits -- Ultra large scale integration -- Reliability.
Integrated circuits -- Effect of radiation on.
Genre/Form
Electronic books.
Other Form:
Print version: Ibe, Eishi H. Terrestrial radiation effects in ULSI devices and electronic systems. Singapore : IEEE : Wiley, c2015 xxiv, 268 pages 9781118479292 2014022262
ISBN
9781118479292
9781118479315 (electronic bk.)
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