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Integrated Circuits Testing
1
E-Book/E-Doc
 

Design for at-speed test, diagnosis, and measurement



Boston : Kluwer Academic, c2000. 2000

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Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
2
E-Book/E-Doc
 

An engineer's guide to automated testing of high-speed interfaces


Moreira, Jose, 1975- author.
Norwood, Massachusetts : Artech House, 2016. 2016

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 Axe ProQuest E-Book  Electronic Book    ---  Available
3
E-Book/E-Doc
 

ESD failure mechanisms and models


Voldman, Steven H.
Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. 2009

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4
E-Book/E-Doc
 

Principles of semiconductor network testing


Afshar, Amir.
Boston : Butterworth-Heinemann, 1995. 1995

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 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
5
E-Book/E-Doc
 

Wafer-level testing and test during burn-in for integrated circuits


Bahukudumbi, Sudarshan.
Boston : Artech House, 2010. 2010

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