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Title Advances in imaging and electron physics. Volume 229 / edited by Martin Htch, Peter W. Hawkes.

Publication Info. London, UK : Academic Press, 2024.

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Location Call No. OPAC Message Status
 Axe Elsevier ScienceDirect Ebook  Electronic Book    ---  Available
Description 1 online resource (80 pages) : illustrations
text txt rdacontent
computer c rdamedia
online resource cr rdacarrier
Bibliography Includes bibliographical references and index.
Summary Advances in Imaging and Electron Physics, Volume 229 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Note Online resource; title from PDF title page (ScienceDirect, viewed April 4, 2024).
Subject Optics.
Lenses.
Optique.
Lentilles (Optique)
optics.
lenses (object genre)
Added Author Hawkes, Peter W., editor.
Htch, Martin, editor.
ISBN 9780443296499 (electronic bk.)
0443296499 (electronic bk.)
9780443296482 (hbk.)
0443296480 (hbk.)

 
    
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