Welcome to the Kids' Library!

Search for books, movies, music, magazines, and more.

Back to Search Results

Available items only

Previous Record Next Record

E-Book/E-Doc

Conference

International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China)

Title Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China / edited by Prasad Yarlagadda and Yun-Hae Kim.

Publication Info.	Zurich, Switzerland : TTP, 2014.
	2014

Connect to
Available to Pittsburg State University patrons only.

Copies

Location	Call No.	OPAC Message	Status
Axe ProQuest E-Book	Electronic Book	---	Available

Description	1 online resource (2012 pages) : illustrations (some color), graphs, tables.
	text rdacontent
	computer rdamedia
	online resource rdacarrier
Series	Applied Mechanics and Materials, 1662-7482 ; Volume 568-570
	Applied mechanics and materials ; Volume 568-570.
Bibliography	Includes bibliographical references at the end of each chapters and indexes.
Note	Description based on online resource; title from PDF title page (ebrary, viewed July 22, 2014).
Subject	Detectors -- Congresses.
	Measurement -- Congresses.
	Measuring instruments -- Congresses.
Genre/Form	Electronic books.
Added Author	Yarlagadda, Prasad, editor.
	Kim, Yun-Hae, editor.
Note	ICMIA 2014
Other Form:	Print version: International Conference on Measurement, Instrumentation and Automation (3rd : 2014 : Shanghai, China) Measurement technology and its application III : selected, peer reviewed papers from the 2014 3rd International Conference on Measurement, Instrumentation and Automation (ICMIA 2014), April 23-24, 2014, Shanghai, China. Zurich, Switzerland : TTP, c2014 2021 pages Applied mechanics and materials ; Volume 568-570. 9783038351382
ISBN	9783038351382
	9783038265214 (electronic bk.)