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Subjects (1-2 of 2)
Metal Oxide Semiconductors Complementary Reliability
1
Transient-induced latchup in CMOS integrated circuits
Ker, Ming-Dou.
Singapore ; Hoboken, NJ : Wiley, c2009. 2009
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Axe ProQuest E-Book
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Metal Oxide Semiconductors Complementary Testing
2
Geometric models for rolling-shutter and push-broom sensors
Ringaby, Erik, author.
Linkoping, Sweden : Linkoping University, 2014. 2014
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