Welcome to the Kids' Library!

Advanced metrology : freeform surfaces

Jiang, X. Jane.
London : Academic Press, 2020. 2020

Data evaluation theory and practice for materials properties

Munro, R. G. (Ronald Gordon)
[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2003] 2003

Fundamental principles of engineering nanometrology

Leach, R. K., author.
Oxford, OX : Elsevier, William Andrew, 2014. 2014

Fundamental principles of engineering nanometrology

Leach, R. K.
Oxford : William Andrew : Elsevier Science, 2010. 2010

Handbook of surface and nanometrology

Whitehouse, D. J. (David J.)
Boca Raton, FL : CRC Press, c2011. 2011

Measurement and monitoring

Giniotis, Vytautas, author.
New York : Momentum Press, LLC, [2014] 2014

Metrology and physical constants : proceedings of the International School of Physics "Enrico Fermi"

Societa italiana di fisica.
Amsterdam, Netherlands : IOS Press, 2013. 2013

Metrology and theory of measurement

Chunovkina, Anna G.
Berlin ; Boston : De Gruyter, [2013] 2013

Optical imaging and metrology advanced technologies

Weinheim, Germany : Wiley-VCH, 2012. 2012

Production metrology

Pfeifer, Tilo, author.
Munchen : Oldenbourg Verlag, [2002] 2002

Quantum metrology : foundation of units and measurements.

Gobel, Ernst O., author.
Weinheim, Germany : Wiley-VCH, 2015. 2015