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Title Microelectronics failure analysis [electronic resource] : desk reference / edited by Richard J. Ross.

Imprint Materials Park, Ohio : ASM International, c2011.


Location Call No. OPAC Message Status
 Axe ProQuest E-Book  Electronic Book    ---  Available
Edition 6th ed.
Description xi, 660 p. : ill.
Bibliography Includes bibliographical references and indexes.
Contents section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
Reproduction Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries.
Subject Electronics -- Materials -- Testing -- Handbooks, manuals, etc.
Microelectronics -- Materials -- Testing -- Handbooks, manuals, etc.
Microelectronics -- Materials -- Defects -- Handbooks, manuals, etc.
Electronic apparatus and appliances -- Testing -- Handbooks, manuals, etc.
Semiconductors -- Defects -- Handbooks, manuals, etc.
Genre/Form Electronic books.
Added Author Ross, Richard J.
ProQuest (Firm)
ISBN 161503725X
9781615037261 (e-book)

Available items only